System calibration is critical to getting accurate measurement data from RF wafer devices. During calibration, a set of known standards must be presented to the tip of the probe. This requires multipl… [View More]
Two-tier RF calibration of a Vector Network Analyzer (VNA) using WinCal XE™ is a technique that allows two RF calibration error sets to be combined into one resulting error set for the VNA error… [View More]
The purpose of this Agilent workshop at European Microwave Week 2011 was to contrast and compare the characteristics of the leading on-wafer calibration methods. Also as a suitable background, it offe… [View More]
System calibration is critical to getting accurate measurement data from RF wafer devices. During calibration, a set of known standards must be presented to the tip of the probe. This requires multipl… [View More]
