Tag Archives: WinCal XE 4.5

The Strengths and Weaknesses of On-Wafer Calibration Methods

There are various on-wafer calibration methods, each with its own set of strengths and weaknesses. Here are four typical calibrations: 1. SOLT – Short Open Load Thru – a robust calibration… [View More]

How to connect WinCal XE 4.5 to a VNA with the new VISA option

With version 4.5, WinCal XE goes beyond GPIB and offers a new, more flexible form of communication with all Vector Network Analyzer (VNA) instruments that support it. For those VNAs WinCal XE offers n… [View More]

Free 30-Day Trial of WinCalXE 4.5 – Get it while it’s Hot

WinCalXE™ 4.5 enhances RF measurement accuracy and productivity through a guided system setup, automatic calibration and validation, and other advanced RF measurement related tools. So why shoul… [View More]