Tag Archives: SOLR

Hybrid, On-Wafer Calibration for 4-Port: The Best of LRRM and SOLR

System calibration is critical to getting accurate measurement data from RF wafer devices. During calibration, a set of known standards must be presented to the tip of the probe. This requires multipl… [View More]

The Strengths and Weaknesses of On-Wafer Calibration Methods

There are various on-wafer calibration methods, each with its own set of strengths and weaknesses. Here are four typical calibrations: 1. SOLT – Short Open Load Thru – a robust calibration… [View More]