Tag Archives: RF Measurement

Hybrid Calibration for 4-Port On-Wafer Probing

Posted on July 1, 2011 by Cascade Microtech Posted in Probe Systems

System calibration is critical to getting accurate measurement data from RF wafer devices. During calibration, a set of known standards must be presented to the tip of the probe. This requires multipl… [View More]

Free 30-Day Trial of WinCalXE 4.5 – Get it while it’s Hot

Posted on May 24, 2011 by Cascade Microtech

WinCalXE™ 4.5 enhances RF measurement accuracy and productivity through a guided system setup, automatic calibration and validation, and other advanced RF measurement related tools. So why shoul… [View More]