Tag Archives: Probe Technologies

Signal Integrity and Need for New Dual-Signal Probes

Posted on September 27, 2011 by Cascade Microtech Posted in Probes

Dual-signal microwave probes find use for both two-port measurements for structures with in-line pads and for multiport measurements particularly where adjacent signals combine for differential excita… [View More]

S-Technology™ Delivers Improved Contact Physics

Posted on April 21, 2011 by Cascade Microtech

S-Technology provides a unique mechanical architecture for our Pyramid Probe® cards which is designed to consistently deliver evenly distributed contact force for solder bump technologies, which a… [View More]