To protect your investment, prevent probing errors and avoid device damage, be sure to carefully follow the four-step cleaning process described here for the off-line cleaning of your Pyramid Probe ca… [View More]
Recent advances in semiconductor processing technology enable the manufacturing of integrated circuits with Through-Silicon Vias (TSVs). TSV is a conducting “nail” that provides an electri… [View More]
The cleaning frequency and intensity needed to keep a Pyramid Probe® operating at its best are related to the probing environment itself. Therefore, the exact formula for cleaning Pyramid Probes m… [View More]
Now available… the first in the series of Viper™ probe cards. Viper probe cards will be used for test of high-volume production wafer-level chip-scale packaged devices (WLCSP). In smart … [View More]
S-Technology provides a unique mechanical architecture for our Pyramid Probe® cards which is designed to consistently deliver evenly distributed contact force for solder bump technologies, which a… [View More]
At SEMICON China 2011, Cascade Microtech (Booth# 2416 with Alltek Company) will exhibit our various RF/Microwave probes, Pyramid Probe ® cards, ATE contactors and engineering test sockets. We also… [View More]
