Tag Archives: Probe Calibration

Influence of Probe Tip Calibration on Measurement Accuracy

Posted on September 8, 2011 by Cascade Microtech Posted in Events

We’re excited to announce that on Tuesday October 11th, at the IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) we’ll be presenting on the topic – Influence of Probe Tip Ca… [View More]

New Device Design Guidelines for RF Probing

Posted on April 29, 2011 by Cascade Microtech

In order to achieve a good calibration and ensure high repeatability of subsequent measurements, pad placement on the device under test (DUT) must be considered. Many of these rules are directly appli… [View More]