Tag Archives: Dual Infinity Probes

Complexity Issues in 4-Port RF Design Architectures

Posted on September 29, 2011 by Cascade Microtech Posted in Probes

Probe-based 4-port device measurements have some unique challenges. Variation in wafer probe location on a calibration standard may cause electrical behavior to vary from the defined standard paramete… [View More]

Today’s Probes and the Differential Circuit Challenge

Posted on March 24, 2011 by Cascade Microtech

Multiport (4-port) network analyzers are often used to characterize differential circuits, and they are increasingly common in a wide range of high frequency applications. Characterization of differen… [View More]