Tag Archives: BlueRay

BlueRay DS Probe System Wins Compound Semiconductor Award

Posted on April 14, 2011 by Cascade Microtech Posted in Probe Systems

On March 22, we were thrilled to learn that our BlueRay™ DS Probe system won Compound Semiconductor magazine’s Metrology, Test and Measurement Award during a presentation at the Compound S… [View More]

The Clear Advantages of a Double-Side Probe System

Posted on March 31, 2011 by Cascade Microtech

Wafer probers are typically designed to place the substrates to a flat chuck and probe from the top side only. If a customer’s substrates are structured on both top and bottom of the wafer, the … [View More]