Challenges with Aluminum Pad Probing
Devices with aluminum pads are much more difficult to probe than devices with gold pads, which are typically on III-V semiconductors. The productivity of characterization engineers is significant… [View More]
Category Archives: Probes
Protecting Wafer Probe Total Cost of Ownership (TCO)
If you’re a probe customer, or thinking of becoming one, we want to make sure that you are not only completely satisfied with your on-wafer probe, but that you’re positioned to maximize yo… [View More]
7 Solvable Small Pad Probing Challenges
Moore’s Law continues to prove itself, as leading semiconductor manufacturers develop smaller devices and even smaller pads. Probing pads with dimensions of 100 μm x 100 μm or 80 μm x … [View More]
Expanding Device Characterization Performance and Productivity
Our Infinity Probe® sets a standard of performance by ensuring better measurements on aluminum pads, reducing reprobing and errors in measured data. We believe it’s a key component of an int… [View More]
InfinityQuad™ Multi-Contact Probe – Small Pad Probing
The new InfinityQuad multi-contact probe was designed to address small pad probing requirements in the engineering and production of DC, logic, RF, and millimeter-wave RFIC devices. A recent article i… [View More]
InfinityQuad™ Multi-Contact Probe a Finalist for Best in Test Award
We’re excited to announce that our new InfinityQuad multi-contact RF/mmW probe is a finalist in Test & Measurement World’s Best in Test awards for 2012. InfinityQuad probe ensures reli… [View More]
