Category Archives: Probe Maintenance

The Strengths and Weaknesses of On-Wafer Calibration Methods

Posted on October 19, 2011 by Cascade Microtech Posted in Probe Maintenance

There are various on-wafer calibration methods, each with its own set of strengths and weaknesses. Here are four typical calibrations: 1. SOLT – Short Open Load Thru – a robust calibration… [View More]

Online Abrasive Cleaning Methods for Pyramid Probe Cards

Posted on June 9, 2011 by Cascade Microtech

The cleaning frequency and intensity needed to keep a Pyramid Probe® operating at its best are related to the probing environment itself. Therefore, the exact formula for cleaning Pyramid Probes m… [View More]