At the IMS2011 (International Microwave Symposium) show in Baltimore last year, our own Craig Kirkpatrick spoke about different techniques for validating a VNA calibration when using microwave probes.… [View More]
A simple answer is in the table below, however, a more advanced answer follows. This question may indicate a basic misunderstanding of on-wafer calibration. So, let's try to correct it. In coaxial… [View More]
We just got our new research paper, Scalable RFCMOS Model for 90nm Technology, published by the International Journal of Microwave Science and Technology. This paper presents the formation of the para… [View More]
System calibration is critical to getting accurate measurement data from RF wafer devices. During calibration, a set of known standards must be presented to the tip of the probe. This requires multipl… [View More]
Two-tier RF calibration of a Vector Network Analyzer (VNA) using WinCal XE™ is a technique that allows two RF calibration error sets to be combined into one resulting error set for the VNA error… [View More]
