Four Step Process for Pyramid Probe Card Core Off-Line Cleaning

Posted on February 16, 2012 by Cascade Microtech Posted in Probe Cards
To protect your investment, prevent probing errors and avoid device damage, be sure to carefully follow the four step cleaning process described here for the off-line cleaning of your Pyramid Probe core
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Achieving Accurate, Wafer-Level Power Device Characterization

Posted on February 7, 2012 by Cascade Microtech
Achieving accurate, wafer-level power device characterization is not easy with the advancements of technology. Our Tesla system addresses 5 challenges today that can help overcome this obstacle.
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New Research Paper – Scalable RFCMOS Model for 90 nm Technology

Posted on February 2, 2012 by Cascade Microtech
We just got our new research paper, Scalable RFCMOS Model for 90nm Technology, published by the International Journal of Microwave Science and Technology.
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Join Us at SEMICON Korea February 7th through the 9th

Posted on January 27, 2012 by Cascade Microtech
Visit the Cascade Microtech booth at SEMICON Korea from February 7th to the 9th and learn more about our new InfinityQuad probe as well as the industrys leading power device measurement system, Tesla.
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Hybrid, On-Wafer Calibration for 4-Port: The Best of LRRM and SOLR

Posted on January 17, 2012 by Cascade Microtech
A combination of LRRM cal with the short-open-load-reciprocal thru (SOLR) cal, creates a hybrid cal that takes advantage of the strengths of both calibration methods for a superior 4-port calibration.
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Application of a Two-Tier Vector Network Analyzer RF Calibration

Posted on January 9, 2012 by Cascade Microtech
Two-tier RF calibration of a Vector Network Analyzer (VNA) using WinCal XE is a technique that allows two RF calibration error sets to be combined into one resulting error set for the VNA error correction.
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