Techniques for Validating a VNA Calibration with Microwave Probes

Posted on May 9, 2012 by Cascade Microtech Posted in Calibration
Using microwave probes? This short presentation discusses ways to validate your VNA calibration so that your measurements will be accurate.
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Tesla On-Wafer Probing – Three Common Questions

Posted on May 2, 2012 by Cascade Microtech
Three common questions regarding the Tesla on-wafer probing system along with the supporting answers. Read our blog to learn more.
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Wafer-Level RF MEMS Device Characterization in a Cryogenic Environment

Posted on April 26, 2012 by Cascade Microtech
Extending the capability of conventional wafer-level probing methodology to extreme environmental conditions is a crucial requirement of both development and manufacturing of RF MEMS devices.
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Challenges with Aluminum Pad Probing

Posted on April 11, 2012 by Cascade Microtech
An RF Prober often runs into challenges with aluminum pad probing, and this blog addresses some of those challenges. The Infinity Probe was created to address these and other challenges.
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Protecting Wafer Probe Total Cost of Ownership (TCO)

Posted on April 5, 2012 by Cascade Microtech
Cascade Microtech has launched a wafer probe repair program to help you maximize your investment and ROI. Check out the program details here.
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Join us in Anaheim at the International Reliability Physics Symposium (IRPS)

Posted on March 29, 2012 by Cascade Microtech
Cascade Microtech will be exhibiting at IRPS (International Reliability Physics Symposium) in Anaheim on April 17-19.
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