Techniques for Validating a VNA Calibration with Microwave Probes

Using microwave probes? This short presentation discusses ways to validate your VNA calibration so that your measurements will be accurate.
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Tesla On-Wafer Probing – Three Common Questions

Three common questions regarding the Tesla on-wafer probing system along with the supporting answers. Read our blog to learn more.
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Wafer-Level RF MEMS Device Characterization in a Cryogenic Environment

Extending the capability of conventional wafer-level probing methodology to extreme environmental conditions is a crucial requirement of both development and manufacturing of RF MEMS devices.
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Challenges with Aluminum Pad Probing

An RF Prober often runs into challenges with aluminum pad probing, and this blog addresses some of those challenges. The Infinity Probe was created to address these and other challenges.
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Protecting Wafer Probe Total Cost of Ownership (TCO)

Cascade Microtech has launched a wafer probe repair program to help you maximize your investment and ROI. Check out the program details here.
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Join us in Anaheim at the International Reliability Physics Symposium (IRPS)

Cascade Microtech will be exhibiting at IRPS (International Reliability Physics Symposium) in Anaheim on April 17-19.
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